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Creep in Ceramics
Kategorie Beschreibung
036aXA-DE
037beng
077a483318086 Druckausg.: ‡Pelleg, Joshua: Creep in ceramics
087q978-3-319-50825-2
100 Pelleg, Joshua
331 Creep in Ceramics
410 Cham
412 Springer
425 2017
425a2017
433 Online-Ressource (XVIII, 445 p. 458 illus., 37 illus. in color, online resource)
451 Solid Mechanics and Its Applications ; 241
527 Druckausg.: ‡Pelleg, Joshua: Creep in ceramics
527 Printed editionISBN: 978-3-319-50825-2
540aISBN 978-3-319-50826-9
700 |TGM
700 |TEC021000
700b|620.11
700c|TA401-TA492
700g1271143267 ZM 6100
750 This textbook is one of its kind, since there are no other books on Creep in Ceramics. The book consist of two parts: A and B. In part A general knowledge of creep in ceramics is considered, while part B specifies creep in technologically important ceramics. Part B covers creep in oxide ceramics, carnides and nitrides. While covering all relevant information regarding raw materials and characterization of creep in ceramics, the book also summarizes most recent innovations and developments in this field as a result of extensive literature search
753 Part A: Basics -- Chapter 1. What is Creep? -- Chapter 2. General Mechanisms of Creep -- Chapter 3. Creep and its Relation to Diffusion -- Chapter 4. Creep in Ceramics -- Chapter 5. Testing Methods for Creep -- Chapter 6. Creep in Nanoceramics -- Chapter 7. Creep Rupture -- Chapter 8. Superplasticity -- Chapter 9. Creep and Recovery -- Chapter 10. Empirical Relations -- Chapter 11. Design for Creep Resistance -- Part B. Creep in Technologically Important Ceramics -- Chapter 12. Creep in Alumina (Al2O3) -- Chapter 13. Creep in Magnesia (MgO) -- Chapter 14. Creep in Zirconia (ZrO2) -- Chapter 15. Creep in Silicon Carbide (SiC) -- Chapter 16. Creep in Boron Carbide (BC) -- Chapter 17. Creep in Silicon Nitride (Si3N4)
902s 208986774 Keramischer Werkstoff
902s 209624914 Kriechen
902s 208897755 Diffusion
012 486675696
081 Pelleg, Joshua: Creep in Ceramics
100 Springer E-Book
125aElektronischer Volltext - Campuslizenz
655e$uhttp://dx.doi.org/10.1007/978-3-319-50826-9
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