| 036a | XD-US |
| 037b | eng |
| 077a | 279525001 Buchausg. u.d.T.: ‡Emerging nanotechnologies |
| 087q | 978-0-387-74746-0 |
| 100b | Tehranipoor, Mohammad |
| 331 | Emerging Nanotechnologies |
| 335 | Test, Defect Tolerance, and Reliability |
| 410 | Boston, MA |
| 412 | Springer Science+Business Media, LLC |
| 425 | 2008 |
| 425a | 2008 |
| 433 | Online-Ressource (digital) |
| 451 | Frontiers in Electronic Testing ; 37 |
| 501 | Includes bibliographical references and index |
| 517 | Front Matter; Defect-Tolerant Logic with Nanoscale Crossbar Circuits; Built-in Self-Test and Defect Tolerance in Molecular Electronics-Based Nanofabrics; Test and Defect Tolerance for Reconfigurable Nanoscale Devices; A Built-In Self-Test and Diagnosis Strategy for Chemically-Assembled Electronic Nanotechnology; Defect Tolerance in Crossbar Array Nano-Architectures; Reversible and Testable Circuits for Molecular QCA Design; Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems; QCA Circuits for Robust Coplanar Crossing. Reliability and Defect Tolerance in Metallic Quantum-Dot Cellular AutomataTest Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems; Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips; Designing Nanoscale Logic Circuits Based on Principles of Markov Random Fields; Towards Nanoelectronics Processor Architectures; Design and Analysis of Fault-Tolerant Molecular Computing Systems; Back Matter |
| 527 | Buchausg. u.d.T.: ‡Emerging nanotechnologies |
| 540a | ISBN 978-0-387-74747-7 |
| 700 | |TJFC |
| 700 | |TEC008010 |
| 700b | |621.3815 |
| 700b | |620.5 |
| 700b | |620 |
| 700c | |TK7888.4 |
| 700g | 1271730413 ZN 3700 |
| 750 | Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field. |
| 902s | 211282081 Nanotechnologie |
| 902s | 215843592 Nanoelektronik |
| 902s | 210671602 Biochip |
| 902s | 216548799 Mikrofluidik |
| 902s | 210068310 Zellularer Automat |
| 902s | 21128209X Nanometerbereich |
| 907s | 211282081 Nanotechnologie |
| 907s | 215843592 Nanoelektronik |
| 907s | 210671602 Biochip |
| 907s | 216548799 Mikrofluidik |
| 907s | 210068310 Zellularer Automat |
| 907s | 21128209X Nanometerbereich |
| 012 | 28057584X |
| 081 | Emerging Nanotechnologies |
| 100 | Springer E-Book |
| 125a | Elektronischer Volltext - Campuslizenz |
| 655e | $uhttp://dx.doi.org/10.1007/978-0-387-74747-7 |
