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Production Planning and Control for Semiconductor Wafer Fabrication Facilities: Modeling, Analysis, and Systems

Kataloginformation Katalogdatensatz500177228 .

Kataloginformation
Feldname	Details
Vorliegende Sprache	eng
Hinweise auf parallele Ausgaben	370685059 Buchausg. u.d.T.: ‡Mönch, Lars, 1967 - : Production planning and control for semiconductor wafer fabrication facilities
ISBN	978-1-4614-4471-8
Name	Mönch, Lars
Name	Fowler, John W.
Name ANZEIGE DER KETTE	Fowler, John W.
Name	Mason, Scott J.
T I T E L	Production Planning and Control for Semiconductor Wafer Fabrication Facilities
Zusatz zum Titel	Modeling, Analysis, and Systems
Verlagsort	New York, NY
Verlag	Springer
Erscheinungsjahr	2013
Erscheinungsjahr	2013
Umfang	Online-Ressource (XII, 288 p. 46 illus., 22 illus. in color, digital)
Reihe	Operations Research/Computer Science Interfaces Series ; 52
Notiz / Fußnoten	Description based upon print version of record
Weiterer Inhalt	Production Planning and Control for Semiconductor Wafer Fabrication Facilities; Preface; Contents; Notation; Chapter 1 Introduction; 1.1 Motivation; 1.2 Outline of the Book; Chapter 2 Semiconductor Manufacturing Process Description; 2.1 Semiconductor Manufacturing Overview; 2.2 Front-End and Back-End Operations; 2.2.1 Overall Framework for Manufacturing Systems; 2.2.2 Description of the Base System; 2.2.3 Description of the Base Process; 2.3 Production Planning and Control Hierarchy; Chapter 3 Modeling and Analysis Tools; 3.1 Systems and Models; 3.1.1 Representation of Systems by Models. 3.1.2 Types of Models3.2 Decision Methods and Descriptive Models; 3.2.1 Optimal Approaches vs. Heuristics; 3.2.2 Branch-and-Bound Algorithms; 3.2.3 Mixed Integer Programming; 3.2.4 Stochastic Programming; 3.2.5 Dynamic Programming; 3.2.6 Neighborhood Search Techniquesand Genetic Algorithms; 3.2.7 Queueing Theory; 3.2.8 Discrete-Event Simulation Techniques; 3.2.9 Response Surface Methodology; 3.2.10 Learning Approaches; 3.2.11 Summary of Decision Methodsand Descriptive Models; 3.3 Performance Assessment; 3.3.1 Performance Assessment Methodology. 3.3.2 Architecture for Simulation-Based Performance AssessmentChapter 4 Dispatching Approaches; 4.1 Motivation and Taxonomy of Dispatching Rules; 4.2 Simple Dispatching Rules; 4.2.1 JS-Related Dispatching Rules; 4.2.2 MS-Related Dispatching Rules; 4.3 Composite Dispatching Rules; 4.3.1 Critical Ratio Dispatching Rules; 4.3.2 ATC-Type Dispatching Rules; 4.3.3 Composite Dispatching Rules for the MS; 4.4 Simulation Results for Assessing Dispatching Rules; 4.5 Batching Rules; 4.6 Look-Ahead Rules; 4.6.1 Dynamic Batching Heuristic; 4.6.2 Next Arrival Control Heuristic. 4.6.3 Additional Look-Ahead Research4.6.4 BATC-Type Rules; 4.7 More Sophisticated Approaches; 4.7.1 Rule-Based Systems; 4.7.2 Determining Parameters of Dispatching Rules Based on Iterative Simulation; 4.7.3 Construction of Blended Dispatching Rules; 4.7.4 Automated Discovery of Dispatching Rules; Chapter 5 Deterministic Scheduling Approaches; 5.1 Motivation and Definitions; 5.2 Simulation-Based Scheduling; 5.3 Equipment Scheduling; 5.3.1 Scheduling Jobs on a Single Batch Machine; 5.3.2 Scheduling Jobs on a Single Cluster Tool. 5.3.3 Scheduling Jobs on Parallel Machineswith Sequence-Dependent Setup Times5.3.4 Scheduling Jobs with Ready Times on ParallelBatch Machines; 5.3.5 Scheduling Problems for Parallel Machines with Auxiliary Resources; 5.3.6 Multiple Orders per Job Scheduling Problems; 5.4 Full Factory Scheduling; 5.4.1 Motivation and Problem Statement; 5.4.2 Disjunctive Graph Representationfor Job Shop Problems; 5.4.3 Decomposition Approach; 5.4.4 Subproblem Solution Procedures; 5.4.5 Simulation-Based Performance Assessment; 5.4.6 Distributed Shifting Bottleneck Heuristic. 5.4.7 Multicriteria Approach to Solve Large-Scale Job Shop Scheduling Problems
Titelhinweis	Buchausg. u.d.T.: ‡Mönch, Lars, 1967 - : Production planning and control for semiconductor wafer fabrication facilities
ISBN	ISBN 978-1-4614-4472-5
Klassifikation	KJMD
	KJT
	BUS049000
	658.40301
	HD30.23
	QP 542
Kurzbeschreibung	Introduction -- Semiconductor Manufacturing Process Description -- Modeling and Analysis Tools -- Dispatching Approaches -- Deterministic Scheduling Approaches -- Order Release Approaches -- Production Planning Approaches -- Production Planning and Control Systems
2. Kurzbeschreibung	Over the last fifty-plus years, the increased complexity and speed of integrated circuits have radically changed our world. Today, semiconductor manufacturing is perhaps the most important segment of the global manufacturing sector. As the semiconductor industry has become more competitive, improving planning and control has become a key factor for business success. This book is devoted to production planning and control problems in semiconductor wafer fabrication facilities. It is the first book that takes a comprehensive look at the role of modeling, analysis, and related information systems for such manufacturing systems. The book provides an operations research- and computer science-based introduction into this important field of semiconductor manufacturing-related research
1. Schlagwortkette	Produktionsplanung
	Produktionskontrolle
	Halbleiterindustrie
ANZEIGE DER KETTE	Produktionsplanung -- Produktionskontrolle -- Halbleiterindustrie
SWB-Titel-Idn	373499817
Signatur	Springer E-Book
Bemerkungen	Elektronischer Volltext - Campuslizenz
Elektronische Adresse	$uhttp://dx.doi.org/10.1007/978-1-4614-4472-5
Internetseite / Link	Volltext
Siehe auch	Volltext
Siehe auch	Cover

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