- Hauptmenü-

Katalogdatenanzeige

Fringe 2005: The 5th International Workshop on Automatic Processing of Fringe Patterns

Kataloginformation Katalogdatensatz500114940 .

Kataloginformation
Feldname	Details
Vorliegende Sprache	eng
Hinweise auf parallele Ausgaben	25297607X Buchausg. u.d.T.: ‡Fringe 2005
ISBN	978-3-540-26037-0
Name	Osten, Wolfgang
T I T E L	Fringe 2005
Zusatz zum Titel	The 5th International Workshop on Automatic Processing of Fringe Patterns
Verlagsort	Berlin, Heidelberg
Verlag	Springer-Verlag Berlin Heidelberg
Erscheinungsjahr	2006
Erscheinungsjahr	2006
Umfang	Online-Ressource (XVIII, 706 p. 448 illus, digital)
Reihe	SpringerLink. Bücher
Notiz / Fußnoten	Includes bibliographical references
Weiterer Inhalt	Optical Measurement Techniques; New Challenges for Optical Metrology: Evolution or Revolution; Interpreting interferometric height measurements using the instrument transfer function; Are Residues of Primary Importance in Phase Unwrapping?; Experimental Study of Coherence Vortices: Birth and Evolution of Phase Singularities in the Spatial Coherence Function; Properties of Isothetic Lines in Discontinuous Fields; Heterodyne, quasi-heterodyne and after; Robust three-dimensional phase unwrapping algorithm for phase contrast magnetic resonance velocity imaging. Signal processing of interferogram using a two-dimensional discrete Hilbert transformRecent advances in automatic demodulation of single fringe patterns; Comparison of Techniques for Fringe Pattern Background Evaluation; Deformed surfaces in holographic Interferometry. Similar aspects concerning nonspherical gravitational fields; Dynamic evaluation of fringe parameters by recurrence processing algorithms; Fast hologram computation for holographic tweezers; Wavelet analysis of speckle patterns with a temporal carrier. Different preprocessing and wavelet transform based filtering techniques to improve Signal- to-noise ratio in DSPI fringesWavefront Optimization using Piston Micro Mirror Arrays; Adaptive Correction to the Speckle Correlation Fringes using twisted nematic LCD; Random phase shift interferometer; Spatial correlation function of the laser speckle field with holographic technique; Fault detection from temporal unusualness in fringe patterns; The Virtual Fringe Projection System (VFPS) and Neural Networks; Fringe contrast enhancement using an interpolation technique. Some remarks on accuracy of imaging polarimetry with carrier frequencyApplication of weighted smoothing splines to the local denoising of digital speckle pattern interferometry fringes; Investigation of the fringe order in multi-component shearography surface strain measurement; Metrological Fringe inpainting; Combination of Digital Image Correlation Techniques and Spatial Phase Shifting Interferometry for 3D-Displacement Detection and Noise Reduction of Phase Difference Data; Photoelastic tomography for birefringence determination in optical microelements. Optimization of electronic speckle pattern interferometersProperties of phase shifting methods applied to time average interferometry of vibrating objects; Depth-resolved displacement measurement using Tilt Scanning Speckle Interferometry; New Phase Unwrapping Strategy for Rapid and Dense 3D Data Acquisition in Structured Light Approach; Determination of modulation and background intensity by uncalibrated temporal phase stepping in a two-bucket spatially phase stepped speckle interferometer; EUVA's challenges toward 0.1nm accuracy in EUV at-wavelength interferometry. Some similarities and dissimilarities of imaging simulation for optical microscopy and lithography
Titelhinweis	Buchausg. u.d.T.: ‡Fringe 2005
ISBN	ISBN 978-3-540-29303-3
Klassifikation	TGPR
	TEC032000
	658.56
	621.36
	535.4
	620
	TA169.7
	T55-T55.3
	TA403.6
Kurzbeschreibung	Key Note -- New Methods and Tools for Data Processing -- Resolution Enhanced Technologies -- Wide Scale 4D Optical Metrology -- Hybrid Measurement Technologies -- New Optical Sensors and Measurement Systems.
2. Kurzbeschreibung	The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Computer aided Evaluation in Structured Light Techniques, Holographic Interferometry, Classic Interferometry, Speckle Metrology, Moiré and Grid Techniques for Stress Analysis, Nondestructive Testing, Shape Measurement, Fault Detection, Quality Control and related fields. Topics of particular interest are: Advanced Computer Aided Measurement Techniques; Resolution Enhanced Technologies in Optical Metrology; New approaches in Wide Scale 4D Optical Metrology; Sophisticated Sensors Systems and their applications for the solution of challenging measurement problems. Special emphasis is put on modern Measurement Strategies taking into account the active combination of Physical Modeling, Computer Aided Simulation and Experimental Data Acquisition. Further attention is directed to new approaches for the Extension of Existing Resolution Limits that open the gates to Wide Scale Metrology ranging from nano to macro by using Advanced Optical Sensor Systems. .
1. Schlagwortkette	Interferogramm
1. Schlagwortkette	Bildauswertung
1. Schlagwortkette ANZEIGE DER KETTE	Interferogramm -- Bildauswertung
2. Schlagwortkette	Optische Messung
2. Schlagwortkette	Messwertverarbeitung
2. Schlagwortkette ANZEIGE DER KETTE	Optische Messung -- Messwertverarbeitung
3. Schlagwortkette	Interferometrie
	Fizeau-Streifen
	Bildauswertung
	Messwertverarbeitung
SWB-Titel-Idn	264355512
Signatur	Springer E-Book
Bemerkungen	Elektronischer Volltext - Campuslizenz
Elektronische Adresse	$uhttp://dx.doi.org/10.1007/3-540-29303-5
Internetseite / Link	Volltext
Siehe auch	Volltext
Siehe auch	Inhaltsverzeichnis
Siehe auch	Cover

ISBD-Anzeige Katalogdatensatz500114940

Kategorien-Anzeige Katalogdatensatz500114940

Titel zur Titelsammlung hinzufügen Katalogdatensatz500114940

Kataloginformation500114940 Datensatzanfang . Kataloginformation500114940 Seitenanfang .

Titel vormerken Katalogdatensatz500114940

Vollanzeige Katalogdaten

Auf diesem Bildschirm erhalten Sie Katalog- und Exemplarinformationen zum ausgewählten Titel.

Im Bereich Kataloginformation werden die bibliographischen Details angezeigt. Per Klick auf Hyperlink-Begriffe wie Schlagwörter, Autoren, Reihen, Körperschaften und Klassifikationen können Sie sich weitere Titel des gewählten Begriffes anzeigen lassen.

Der Bereich Exemplarinformationen enthält zum einen Angaben über den Standort und die Verfügbarkeit der Exemplare. Zum anderen haben Sie die Möglichkeit, ausgeliehene Exemplare vorzumerken oder Exemplare aus dem Magazin zu bestellen.